New industry standard silicon probes from Bruker
Submitted by user_64683 on 25 June, 2015.
Published date:
Thursday, June 25, 2015 - 10:30
Bruker has introduces its latest RTESP/RTESPA silicon AFM probes for TappingMode and non-contact imaging modes.
Described as an improved version of its MPP Line of AFM probes, the etched silicon probes are said to complement the TESP-V2 range of probes and set the industry standard for imaging in TappingMode and non-contact mode in air.
The probes can also be used for force modulation measurements and contact mode imaging.
The new RTESP/A design provides a rotated probe tip for more symmetrical representation of sample features.
It also offers tighter dimensional specifications for improved probe to probe consistency as well as tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip.
According to the company, the latest products deliver improved probe quality and aesthetics.
Learn more here.
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