Micro to Nano introduces EM-Tec SEM sample holders
Submitted by user_64683 on 30 October, 2015.
Published date:
Friday, October 30, 2015 - 12:00
Micro to Nano has introduced a range of EM-Tec SEM sample holders that offer an affordable, safe and secure way to hold SEM samples for imaging and analysis.
The holders are said to maintain sample integrity, avoid contamination issues and use no adhesives.
EM-Tec SEM sample holders for safe and secure imaging.
According to the company, by selecting the appropriate SEM sample holder, using the SEM becomes easier and additional applications can be unlocked.
In addition to the sample holders, EM-Tec SEM stage adapters have been introduced for virtually all models of JEOL, Zeiss, FEI, Hitachi and Tescan SEMs.
These stage adapters enable the use of the EM-Tec SEM sample holders across any SEM platforms, independent of SEM brand.
The range of SEM sample holders currently includes vise clamp and spring-loaded vise holders, S-Clip, multi-stub, bulk and metallographic sample holders as well as reference, wafer, EBSD, tilt, swivel and geological slide holders.
Special EM-Tec SEM sample holders which enhance the use of SEMs are the STEM imaging, FIB and the 90 degree off-set holders.
Smaller EM-Tec holders are also available, which are modified standard SEM stubs.
These will fit in the standard SEM stub holder on the SEM and do not require an additional SEM stage adapter.
For the growing table top and bench top SEM such as the Phenom, Hitachi TM series and the JEOL Neoscope, Micro to Nano has recently developed the EM-Tec Gold Series SEM sample holders.
These compact yet versatile SEM sample holders are specifically designed to hold smaller samples and are compatible with the smaller table top SEMs.
Learn more here.
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