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European Microscopy Society Outstanding Paper Award 2012

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Bruker introduces high-contrast TERS probe tips for IRIS system

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FEI launches broad correlative microscopy solution set for cell biologists

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Cairn is UK distributor for Crest X-Light spinning disk confocal system

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Bruker launches NanoLens AFM zoom option for its 3D light microscopes

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Olympus has released the FluoView FV1200 confocal laser scanning microscope

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Linkam Scientific stage for correlative cryo light electron and X-ray...

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Cardiff University team uses Imsol fluorescence system to study neuronal stem...

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Xradia Scout and Scan intuitive control software for Versa X-ray microscopes

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Phenom World introduces elemental mapping for its desktop SEM

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Raptor launches Kingfisher V ultra-sensitive 6 megapixel cooled CCD

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Molecular Devices real-time super-resolution system for MetaMorph software

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Park Systems launches the NX20 large sample AFM for semiconductor labs

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FEI MLA EXpress provides turn-key automated SEM EDX mineralogy

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PerkinElmer launches latest version of inForm image analysis software

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Carl Zeiss launches open application development for ZEN software

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GE IN Cell Analyzer 2200 provides fast sensitive high-content imaging

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Oregon university receives $1 million grant from Keck Foundation to advance...

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Oxford Instruments launches LayerProbe for SEM layer thickness measurement

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Herzan push-button site survey tool measures all environmental noise levels

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